X-Ray Diffraction Analysis (XRD)

Washington Mills’ state-of-art X-Ray Diffraction (XRD) equipment identifies the crystal structure of many different solid materials. Our laboratory technicians are trained experts at material characterization and specialize in using XRD techniques to perform non-destructive analysis of crystalline solids, organic and non-organic materials and grains and powders. Our X-Ray Diffraction (XRD) services are competitively priced and we can provide a quick turn-around for your samples. If you would like more information, please contact us to learn more about our XRD services and capabilities.

X-Ray Diffraction (XRD) Applications:

• Non-destructive analysis of a wide range of materials including: Soils • Ceramics • Stone • Pigments • Airborne Particulates • Cement • Steel • Pharmaceuticals • Glass • Textiles • Minerals • Paints • Clays • Cosmetics • Rocks • Chemicals • Polymers • Plastics • Semiconductors • Powder • Many more materials.

X-Ray Diffraction Analysis (XRD) Capabilities:

• Phase analysis of organic and inorganic compounds and information on the crystal structure and chemical composition of the material.
• Automated diffractometer for crystalline phase characterization. Qualitative and quantitative capabilities enable us to directly determine the crystalline compounds and free elements in a wide range of samples that pass through our analytical lab.
• X-Ray Diffraction (XRD) is a non destructive analysis.
• Residual stress investigations.
• Automatic sample changer, capable of scanning 35 samples overnight, conducting peak search and supplying computer printout and profile.
• JCPDS (Joint Committee on Powder Diffraction Standards) database containing approximately 35,000 inorganic and 10,000 organic crystalline compounds for computer-aided phase identification.
• Characterization of simple chemical compounds to very complex solid solution materials (alloys) and silicate minerals such as clays, feldspars, micas etc.
• Positive identification of asbestos in various materials.
• Identification of multiphase specimens containing up to 10 crystalline compounds.
• Identification of various polymorphs (more than one crystal structure) of many substances i.e. crystalline SiO2, quartz, cristobalite, tridymite.
• Typical detection limit with XRD analysis is 0.5%.
• Capable of quantitative analysis of most crystalline substances, such as the determination of free crystalline silica in many refractory and ceramic materials such as Al2O3 (Aluminum Oxide) in alumina.